Lab-on-CMOS sensors have shown great promise in biological cell monitoring due to their potential for making label-free, high-throughput, and high-resolution measurements. However, validation of sensor data in real-time is vital in order to make sure signals originate from biological sources. This is a challenging task due to the difficulties in obtaining ground-truth and sensor data simultaneously.
The platform was used to validate a CMOS capacitance sensor [1], [2], [3] that is used to monitor cell viability, proliferation, and death. The chip consists of a 4 × 4 array of sensor pixels, each with a set of interdigitated input electrodes that are insulated using the standard CMOS passivation layer. This layer acts as a substrate for adherent cells to grow on. Cells are initially round in shape when first seeded into the culture well. Over time, they will adhere to the substrate, flatten in shape, spread out across the substrate, and proliferate. These changes in cell morphology modulate the dielectric properties of the cell-substrate interface which can then then be measured as changes in surface capacitance.
Morphological changes as cells first settle onto the CMOS chip, adhere, and proliferate.
Multiple cells undergoing mitosis where the parent cell contracts and splits into two daughter cells.
Cells deforming and shrinking in response to a cytotoxic agent.
# | Cell Type | Exp. Duration (hrs.) | Media |
---|---|---|---|
1 | A2780 | 59 | |
2 | A2780 | 58 | |
3 | A2780 | 66 | |
4 | CP70 | 63 | |
5 | CP70 | 63 |