Srivastava Receives NSF Grant for Circuit Optimization ResearchECE Assistant Professor Ankur Srivastava received a three-year National Science Foundation (NSF) grant for his research titled "Optimization Schemes for Large Scale Digital Circuits in Presence of Fabrication Randomness."
Prof. Srivastava's research is aimed at improving the productivity and profitability of the semiconductor industry, and improving the applicability of nanotechnology where manufacturing randomness of digital circuits is a major concern.
Reduction in fabrication dimensions has resulted in a significant increase in the randomness associated with the parameters of large scale digital circuits. This has begun to severely impact the manufacturing yield and therefore the profitability of the semiconductor industry. In his research, Prof. Srivastava is focusing on developing formal optimization schemes for synthesizing large scale digital circuits while proactively considering randomness induced yield loss as an optimization criteria.
For more information, visit the NSF website.
Published September 25, 2007