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With new energy, electronics, and consumer product applications, and the emergence of highthroughput reactor designs, Atomic Layer Deposition (ALD) is set to become a major thin-film manufacturing tool.


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The research will further the fundamental understanding of the dual optimality characteristic of the super acute ear of the fly Ormia, and to use this understanding to develop novel fly-ear inspired sensor systems with optimal performance and tuning capabilities. The proposed approach is summarized as follows.


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