Process Sensing and Simulation for GaN-based Semiconductor Electronics


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  • In-situ Semiconductor Process Metrology for Real-Time APC (advanced Process Control)

In-situ Semiconductor Process Metrology for Real-Time APC (advanced Process Control)


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Digital Control of a Near-Field Scanning Optical Microscope


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  • The MDLe Project: Towards a Universal Language for Sensor-based Feedback Control

The MDLe Project: Towards a Universal Language for Sensor-based Feedback Control


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Control of a Magnetostrictive Actuator with Application to Micropositioning


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Formation Dynamics under a Class of Control Laws


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  • On-Board Dynamic Power and Bandwidth Allocation in Next Generation Ka-Based Satellites

On-Board Dynamic Power and Bandwidth Allocation in Next Generation Ka-Based Satellites


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Network Modeling and Simulations for Internet Services


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Optical Wireless Networks with Topology Control


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Distributed Authenticated Key Generation for Mobile Ad Hoc Networks


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