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A. James Clark School of Engineering, University of Maryland
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Research Posters
Voltage Noise-Induced DRAM Soft Error Reduction Technique for 3D CPUs
Voltage Noise-Induced DRAM Soft Error Reduction Technique for 3D CPUs
Faculty
Ankur Srivastava
, Tiantao Lu, Caleb Serafy, Zhiyuan Yang
Year
2017
Research Area
Communications and Security
File
Voltage_noise.pdf
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Voltage_noise.pdf
Voltage_noise.pdf
Voltage_noise.pdf