Introduction to Focused Ion Beam for the new FIB operator, Day 4 of 4
Thursday, June 28, 2018
9:30 a.m.-11:45 a.m.
1207 (Large Conference Room), ERF
301 405 0876
Focused Ion Beam (FIB) is an extremely useful and powerful tool in physical/materials science, engineering, biological and medical sciences research. The AIM Lab at NanoCenter will be offering a short course in FIB during this summer break (June 2018) using our new Tescan dual beam FIB system. The short course provides an introduction to the FIB for those with little or no prior experience. This course covers basic principles and knowledge of operating the FIB. In addition to lectures, there will be an emphasis on laboratory exercises that focus on instrument operation and practical applications.
Date: June 25, 26, 27 and 28, 2018
Lecture: 9:30 to 11:30 am.
Room: 1207 (Large Conference Room) in IREAP, ERF Build.
Laboratory: Two hours/group/day (4 days, January 25, 26, 29 and 30, 2018)
Lab: FIB facility, Room 1237E, Kim Building
Limit: Maximum enrollment is 9 (3 lab groups, 3 persons per group)
Fee: $450 per person, $400 per person from the same research group. Fees for non-UMD participants will be different. Please check with the AIM Lab office.
Prerequisite: Must have SEM experience or permission from instructor.
To enroll, please print and fill out the application form, and submit to the AIM Lab office by 12:00 pm, June 20, 2018 (Wednesday) at room 1234 Kim Building. Students accepted into the class will be informed by e-mail by Friday (06/22/18).
For more information regarding the FIB short course, please contact Wen-An Chiou at AIM Lab, or (301)-405-0541 or send an e-mail to email@example.com