Clark School Home UMD

ISR News Story

AIM Lab Offers SEM, TEM and FIB Short Courses


Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and FIB (Focused Ion Beam) short courses that will be offered this winter (January 14 to 17, 2018 for SEM, January 22 to 25 for TEM and January 28 to 31 for FIB) at the AIM Lab, NanoCenter.  

These short courses provide an introduction to SEM, TEM and FIB, both theory and hands-on practice, for anyone with little or no prior experience.  Attendees will gain basic knowledge of how to operate a SEM and/or TEM and/or FIB after taking the short course.  This course is also recommended as a refresher course to individuals with prior knowledge and operating familiarity with the SEM and/or TEM and/or FIB. 

The deadline for registration is January 10, 17 and 23, 2018  for SEM, TEM and FIB short courses, respectively.


To register, contact Dr. Wen-An Chiou, Director of the AIM Lab, Maryland NanoCenter. 
(301)-405-0541 
wachiou@umd.edu

January 3, 2019


Prev   Next

 

 

Current Headlines

Company Co-Founded by Sergio Baron Delivers Ultra-Thin, Custom Shape Lithium Batteries

UMD Invention of the Year Nominees Push Limits in Cybersecurity, Health, Quantum Computing, and More

ISR friend John Rinzel wins IBT Mathematical Neuroscience Award

Miao Yu honored with USM Regents Faculty Award

ISR alum Craig Lawrence joins ARLIS

Alumnus Xiaobo Tan elevated to ASME Fellow

Ghodssi gives distinguished lecture on devices for gastrointestinal health at EPFL in Switzerland

Wang Group Develops Highly Reversible 5.3 V Battery

Czech prime minister views AI, VR, AR and computer vision research

Wachsman and Wang “Battery 500” Awards selected for Phase II

News Resources

Return to Newsroom

Search News

Archived News

Events Resources

Events Calendar